Portada de Manufacturing planning and control systems

Manufacturing planning and control systems

Thomas E. Vollmann

904 páginas1988Dow Jones-IrwinInglés2nd ed.

Serie o saga: The Dow Jones-Irwin/APICS series in production management

Esta parte de readmunity es para lectores con cuenta.

Con una cuenta gratuita puedes guardarlo en tu biblioteca, valorarlo y reseñarlo.

Sinopsis(en Inglés)

No tenemos la sinopsis en tu idioma: se muestra la de la edición original.

In the fourth edition of Manufacturing Planning and Control Systems, state-of-the-art concepts and proven techniques are combined to offer a practical solution to enhancing the manufacturing process. Although most of the basic principles and techniques have remained constant in the field, the supporting examples in this edition have been updated and improved to better explain manufacturing planning and control theories. The authors show you how to take advantage of recent advances and produce goods and services more efficiently. They offer insightful explanations and directions for just-in-time (JIT) manufacturing, master production scheduling, distribution requirements planning and flexible manufacturing systems. Manufacturing Planning and Control Systems, Fourth Edition, is specifically written to aid readers studying for the APICS certification examination. Whether you're studying for the APICS certification examination or looking for ways to improve your existing manufacturing process, Manufacturing Planning and Control Systems, Fourth Edition, is the resource to turn to.

Citas

Todavía nadie ha guardado citas de este libro. Añádelo a tu biblioteca y podrás apuntar aquí los pasajes que quieras recordar.

Reseñas

Todavía no hay reseñas de este libro.

Más de este autor

Ver todos

Otras ediciones

  • inglésIrwinISBN 97802560616731988
  • inglésBusiness ProfessionalISBN 97807863120921997
  • inglésIrwinISBN 97802560880831992
  • inglésDow Jones-IrwinISBN 97815562301581988
  • inglésDow Jones-IrwinISBN 97808709445291984
ISBN 9780256061673Metadatos: Metadatos abiertos (Open Library, CC0/PD) · registro de origen